C3.0. Overview
This component lists the crystal planes of the selected crystal and calculates the structural scattering factor for various radiation sources. The lower part of the screen displays information about each crystal plane such as index, multiplicity, q, 2θ, and F (atomic scattering factor).
C3.1. Incident Radiation
X-ray
Specify X-ray as the radiation source. For characteristic X-rays, select the element type and transition condition (Siegbahn notation). For synchrotron X-rays or other sources, set the Element to 0 and directly enter the energy or wavelength.
Electron
Enter the energy or wavelength directly.
Neutron
Enter the energy or wavelength directly.
C3.2. Options
Powder diffraction intensities
Displays the intensities when polycrystalline material is measured with Bragg-Brentano optical geometry.
Threshold of d-spacing
Crystal planes with d-spacing greater than this value will be included in the calculation.
Hide equivalent planes
When checked, eliminates duplicate crystallographically equivalent planes from the display.
Copy to clipboard
Clicking this button copies the information in the list displayed at the bottom of the screen to the clipboard. The data is tab-delimited and can be pasted directly into Excel.
Hide equivalent planes
When checked, eliminates planes that violate systematic absences from the display.